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Premium, Ultra Low Particle, 300mm Test Monitor Wafers
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| LPD Count |
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<100 at ≥ 0.065 μm |
| Conductivity Type |
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P type – Boron Doped |
| Orientation |
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<100> |
| Growth Method |
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MCZ |
| Diameter |
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299.80 – 300.20 mm |
| Center Thickness |
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750.0 – 800.0 μm |
| GBIR |
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<10.0 μm |
| Warp BF |
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<100.0 μm |
| CZ Resistivity |
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1.000 – 100.000 Ω−cm |
Call 510.490.8260 for Pricing |
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Click here for more information on Low Haze Test Wafers.
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