|
 |
Refractive Indices for Oxide Vacuum Evaporation Materials
Transmitted Wavelength Range and Refractive Index for Oxide Vacuum Evaporation Materials
(Data provided for reference purposes only)
|
 |
Wavelength in μm |
- The refractive indices shown are measurements at 500 nm
- A transmitted wavelength range indicates the range of wavelengths where transmittance is reduced to 10% when the thickness is 2mm.
|
Refractive Index Table for Oxide Vacuum Evaporation Materials
(Data provided for reference purposes only)
| Material |
Refractive Index |
SiO2
Silicon Dioxide |
n = 1.46 |
Al2O3
Aluminum Oxide |
n = 1.63 |
Y2O3
Yttrium Oxide |
n = 1.87 |
ZrO2
Zirconium Oxide |
n = 2.05 |
Ta2O5
Tantalum Oxide |
n = 2.1 |
OH-5
ZrO2 + TiO2 Composite |
n = 2.1 |
TiO2
Titanium Oxide |
n = 2.35 |
Ce2O3
Cerium Oxide |
n = 2.3 |
|
|
